5th International Conference on Spectroscopic Ellipsometry (ICSE-V)TOMPKINS, Harland G.Thin solid films. 2011, Vol 519, Num 9, issn 0040-6090, 444 p.Conference Proceedings

Determination of the Dill parameters of thick positive resist for use in modeling applicationsROEDER, G; LIU, S; AYGUN, G et al.Thin solid films. 2011, Vol 519, Num 9, pp 2978-2984, issn 0040-6090, 7 p.Conference Paper

Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layersLOHNER, T; CSIKVARI, P; KHANH, N. Q et al.Thin solid films. 2011, Vol 519, Num 9, pp 2806-2810, issn 0040-6090, 5 p.Conference Paper

The intertwined history of polarimetry and ellipsometryAZZAM, R. M. A.Thin solid films. 2011, Vol 519, Num 9, pp 2584-2588, issn 0040-6090, 5 p.Conference Paper

Development of spectroscopic transmission-type four detector polarimeterTSURU, T; KUBOTA, Y; TADOKORO, T et al.Thin solid films. 2011, Vol 519, Num 9, pp 2707-2710, issn 0040-6090, 4 p.Conference Paper

Electrodynamics of ultrathin gold films at the insulator-to-metal transitionHÖVEL, Martin; GOMPF, Bruno; DRESSEL, Martin et al.Thin solid films. 2011, Vol 519, Num 9, pp 2955-2958, issn 0040-6090, 4 p.Conference Paper

Evaluation of coated and uncoated CaF₂ optics by variable angle spectroscopic ellipsometryJUE WANG; VANKERKHOVE, Steven; SCHREIBER, Horst et al.Thin solid films. 2011, Vol 519, Num 9, pp 2881-2884, issn 0040-6090, 4 p.Conference Paper

Infrared ellipsometry of highly oriented pyrolytic graphiteHUMLICEK, J; NEBOJSA, A; MUNZ, F et al.Thin solid films. 2011, Vol 519, Num 9, pp 2624-2626, issn 0040-6090, 3 p.Conference Paper

Optical and structural properties of solution deposited nickel manganite thin filmsPODRAZA, N. J; SAINT JOHN, D. B; KO, S. W et al.Thin solid films. 2011, Vol 519, Num 9, pp 2919-2923, issn 0040-6090, 5 p.Conference Paper

Application of ellipsometry techniques to biological materialsARWIN, Hans.Thin solid films. 2011, Vol 519, Num 9, pp 2589-2592, issn 0040-6090, 4 p.Conference Paper

Ellipsometric study of nanostructured carbon films deposited by pulsed laser depositionBEREZNAI, M; BUDAI, J; HANYECZ, I et al.Thin solid films. 2011, Vol 519, Num 9, pp 2989-2993, issn 0040-6090, 5 p.Conference Paper

Generalized ellipsometry of artificially designed line width roughnessFOLDYNA, Martin; GERMER, Thomas A; BERGNER, Brent C et al.Thin solid films. 2011, Vol 519, Num 9, pp 2633-2636, issn 0040-6090, 4 p.Conference Paper

Improvement for sensitivity of biosensor with total internal reflection imaging ellipsometry (TIRIE)LI LIU; CHEN, Yan-Yan; MENG, Yong-Hong et al.Thin solid films. 2011, Vol 519, Num 9, pp 2758-2762, issn 0040-6090, 5 p.Conference Paper

Optical characterization of nanocrystals in silicon rich oxide superlattices and porous siliconAGOCS, E; PETRIK, P; MILITA, S et al.Thin solid films. 2011, Vol 519, Num 9, pp 3002-3005, issn 0040-6090, 4 p.Conference Paper

Rotatable broadband retarders for far-infrared spectroscopic ellipsometryKANG, T. D; STANDARD, E; CARR, G. L et al.Thin solid films. 2011, Vol 519, Num 9, pp 2698-2702, issn 0040-6090, 5 p.Conference Paper

Rotating compensator sampling for spectroscopic imaging ellipsometryMENG, Y. H; JIN, G.Thin solid films. 2011, Vol 519, Num 9, pp 2742-2745, issn 0040-6090, 4 p.Conference Paper

Vacuum-ultraviolet reflectance difference spectroscopy for characterizing dielectrics―semiconductor interfacesOGATA, Shoichi; OHNO, Shinya; TANAKA, Masatoshi et al.Thin solid films. 2011, Vol 519, Num 9, pp 2830-2833, issn 0040-6090, 4 p.Conference Paper

Optical conductivity of fci-ZnMgRE quasicrystalsTUMENAS, S; KARPUS, V; ARWIN, H et al.Thin solid films. 2011, Vol 519, Num 9, pp 2951-2954, issn 0040-6090, 4 p.Conference Paper

Studies of optical anisotropy in opals by normal incidence ellipsometryREZA, A; BALEVICIUS, Z; VAISNORAS, R et al.Thin solid films. 2011, Vol 519, Num 9, pp 2641-2644, issn 0040-6090, 4 p.Conference Paper

Transmission Mueller matrix ellipsometry of chirality switching phenomenaARTEAGA, Oriol; EL-HACHEMI, Zoubir; CANILLAS, Adolf et al.Thin solid films. 2011, Vol 519, Num 9, pp 2617-2623, issn 0040-6090, 7 p.Conference Paper

Validity of Lorentz―Lorenz equation in porosimetry studiesSCHWARZ, Daniel; WORMEESTER, Herbert; POELSEMA, Bene et al.Thin solid films. 2011, Vol 519, Num 9, pp 2994-2997, issn 0040-6090, 4 p.Conference Paper

Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometryBARROSO, F; BOSCH, S; TORT, N et al.Thin solid films. 2011, Vol 519, Num 9, pp 2801-2805, issn 0040-6090, 5 p.Conference Paper

Determination of the refractive index of single crystal bulk samples and micro-structuresSCHMIDT-GRUND, R; KÜHNE, P; CZEKALLA, C et al.Thin solid films. 2011, Vol 519, Num 9, pp 2777-2781, issn 0040-6090, 5 p.Conference Paper

Ellipsometric characterisation of thin films non-uniform in thicknessNECAS, David; FRANTA, Daniel; BURSIKOVA, Vilma et al.Thin solid films. 2011, Vol 519, Num 9, pp 2715-2717, issn 0040-6090, 3 p.Conference Paper

Investigation of surface roughness on etched glass surfacesPAPA, Z; BUDAI, J; FARKAS, B et al.Thin solid films. 2011, Vol 519, Num 9, pp 2903-2906, issn 0040-6090, 4 p.Conference Paper